VLSI test principles and architectures : design for testability - Wang, Laung-Terng.; Wu, Cheng-Wen, EE Ph. D.; Wen, Xiaoqing (Amsterdam ; Boston : Elsevier / Morgan Kaufmann Publishers, 2006)
Περιέχει βιβλιογραφία και ευρετήριο
Keywords: Integrated circuits -- Very large scale integration -- Testing; Integrated circuits -- Very large scale integration -- Design