00822nam a22002175 4500 1/23247 040524s1998 enka 001 0 eng 0792382951 24784 DLC GR-PeUP 621.39'5 KRS Krstic, Angela 1965- Delay fault testing for VLSI circuits/ Angela Krstic,Kwang-Ting (Tim) Cheng Boston : Kluwer Academic Publishers, ; 1998 xii, 191 σ. : ill. ; 24 εκ. Includes bibliographical references and index. Integrated circuits Very large scale integration Testing. Delay faults (Semiconductors) Cheng, Kwang-Ting 1961- INST UNIPILB MAIN 20040910 621.39'5 KRS 00143819 00143819 LOAN 0 1 /webopac/covers/02/24784_0792382951.jpg