00978nam a2200253 4500 1/23242 040917s1997 enk b 001 0 eng d 0792399455 24779 DLC GR-PeUP 621.39'50287 CHA Introduction to IDDQ testing / by Sreejit Chakravarty, Paul J. Thadikaran Boston : Kluwer Academic Pub., 1997 322 σ. : πίν., εικ. ; 24 εκ. Frontiers in electronic testing ; Περιέχει ευρετήριο Περιέχει βιβλιογραφία Iddq testing. Digital integrated circuits Testing. Integrated circuits Very large scale integration Testing. Thadikaran, Paul J. Frontiers in electronic testing. INST UNIPILB MAIN 20040917 621.39'50287 CHA 00143847 00143847 LOAN 0 1 /webopac/covers/02/24779_0792399455.jpg